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Daily Archives: Thursday June 27th, 2019
SSDM 2019: paper accepted
The following paper has been accepted as an oral presentation in International Conference on Solid State Devices and Materials (SSDM) 2019. Kunihiro Oshima, Michiaki Saito, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato, “Experimental study of bias stress degradation … Continue reading
Posted in Conference/Workshop
Tagged device model, JSAP, organic, reliability, SSDM
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