Daily Archives: Monday January 29th, 2018

ACM/IEEE ASP-DAC 2018

Posted on Monday January 29th, 2018 by ts

Mr.  Shumpei Morita presented his paper in the 23rd Asia and South Pacific Design Automation Conference (ASP-DAC 2018) held in Jeju Island, Korea. Morita’s talk was about the analysis of the circuit degradation. The effect of negative bias temperature instability (NBTI) … Continue reading →

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