Monthly Archives: January 2018
Mr. Shumpei Morita presented his paper in the 23rd Asia and South Pacific Design Automation Conference (ASP-DAC 2018) held in Jeju Island, Korea. Morita’s talk was about the analysis of the circuit degradation. The effect of negative bias temperature instability (NBTI) … Continue reading
The following paper has been accepted for presentation in the IEEE International Symposium on Circuits and Systems (ISCAS) 2018. The conference will be held in May 27-30, 2018 in Florence, Italy. Yuki Tanaka, Song Bian, Masayuki Hiromoto, and Takashi Sato: “Coin Flipping … Continue reading
Sorry, this entry is only available in 日本語.
The following paper has been accepted for presentation in International Power Electronics Conference (IPEC2018). The conference will be held in May 20-24, 2018 in Niigata, Japan. Michihiro Shintani, Benjamin Dauphin, Kazuki Oishi, Masayuki Hiromoto, and Takashi Sato: “Plotter-Based Automatic Measurements … Continue reading