Daily Archives: Thursday January 5th, 2017

Paper accepted for publication in IEEE Transactions on Very Large Scale Integration Systems

The following paper has been accepted for publication in IEEE Transactions on Very Large Scale Integration Systems (TVLSI). Hiromitsu Awano, Shumpei Morita, and Takashi Sato: “Scalable device array for statistical characterization of BTI-related parameters,” IEEE Transactions on Very Large Scale … Continue reading

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