Daily Archives: Wednesday August 24th, 2016

Paper accepted for publication in Journal of Electronic Testing: Theory and Applications

Posted on Wednesday August 24th, 2016 by hiromoto

Following paper has been accepted for publication in Journal of Electronic Testing: Theory and Applications (JETTA). Michihiro Shintani, Takumi Uezono, Kazumi Hatayama, Kazuya Masu, and Takashi Sato: “Path Clustering for Test Pattern Reduction of Variation-Aware Adaptive Path Delay Testing,” Journal … Continue reading →

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