Daily Archives: 2014年01月06日 星期一

一篇文章被收录于 IEICE Transactions

以下文章被收录于IEICE Transactions on Electronics. Shiho Hagiwara, Takanori Date, Kazuya Masu, and Takashi Sato, “Hypersphere Sampling for Accelerating High-Dimension and Low-Failure Probability Circuit-Yield Analysis,” to appear in IEICE Transactions on Electronics.

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