- device model
- homomorphic encryption
- novel computation
- power electronics
Monthly Archives: January 2014
The following paper has been accepted for publication in IEICE Transactions on Electronics. Michihiro Shintani, Takumi Uezono, Tomoyuki Takahashi, Kazumi Hatayama, Takashi Aikyo, Kazuya Masu, and Takashi Sato, “A Variability-Aware Adaptive Test Flow for Test Quality Improvement,” to appear in … Continue reading
The following paper has been accepted for publication in IEICE Transactions on Electronics. Shiho Hagiwara, Takanori Date, Kazuya Masu, and Takashi Sato, “Hypersphere Sampling for Accelerating High-Dimension and Low-Failure Probability Circuit-Yield Analysis,” to appear in IEICE Transactions on Electronics.
The following paper has been published on the January issue of Trans. IEICE(Kyoto University repository). This was a joint work with Murata Manufacturing, Co. Ltd., Tokyo Institute of Technology, and our group in Kyoto University. Koh Yamanaga, Shiho Hagiwara, Ryo … Continue reading