Yearly Archives: 2013
End-of-year party has been held on December 18th, 2013. We had a great SUKIYAKI dinner looking back this past year and looking forward to a new year.
On Dec. 9, professor Rung-Bin Lin and his students came to Kyoto University. Our laboratory hosted their visit and hold an exchange meeting, including introductions, discussions, a campus tour and lunch. It was very good experience for the students to … Continue reading
End-of-year party will be held at 7pm on December 18th, 2013. For alumni and alumnae: please RSVP to the faculties by December 17th.
After the VMC2013 workshop, Sato visited the d.school at Stanford University. After the VMC2013 workshop, Sato visited the d.school at Stanford University.
On Nov. 21, Mr. Awano presented his recent work on long term reliability of VLSI circuits at VMC2013 held in San Jose. Bias temperature instability (BTI) is considered to have significant impact on long term reliability of VLSI. At the … Continue reading
Prof. Sato gave a talk in ASICON 2013, which is held on Oct.28-31, 2013, in Shenzhen, China. Takashi Sato, “Statistical simulation methods for analyzing performance of low supply voltage circuits (invited),” in Proc. IEEE 10th International Conference on ASIC (ASICON), … Continue reading
A paper has been just published in the November issue of IEEE Transactions on Electron Devices. J.B. Velamala, K.B. Sutaria, H. Shimizu, H. Awano, T. Sato, G. Wirth, and Y. Cao, “Compact Modeling of Statistical BTI Under Trapping/Detrapping,” IEEE Transactions … Continue reading
On October 21st, Mr. Takashi Imagawa presented his recent work at the 18th Workshop on Synthesis And System Integration of Mixed Information technologies (SASIMI 2013), which was held in Sapporo, Japan. This work was chosen for one of the “SASIMI … Continue reading
The following paper has been accepted in the IEICE Transactions on Electronics. Koh Yamanaga, Shiho Hagiwara, Ryo Takahashi, Kazuya Masu, and Takashi Sato, “State-Dependence of On-Chip Power Distribution Network Capacitance: Measurement and Analysis, to appear in IEICE Transactions on Electronics, … Continue reading
Sorry, this entry is only available in 中文 and 日本語.