Daily Archives: Wednesday June 13th, 2012

DAC 2012 (06/03-07)

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IEEE VTS’12 (04/23-26)

2012年4月23日〜26日に,アメリカ合衆国・ハワイ州,Hyatt Mauiにて IEEE VTS’12 (30th VLSI Test Symposium) が開催され,D2 新谷が発表を行いました. Michihiro Shintani and Takashi Sato, “A Bayesian-based process parameter estimation using IDDQ current signature,” IEEE VLSI test symposium (VTS), pp.86-91, April, 2012.

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