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November 2025 M T W T F S S « Apr 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 Archives
Tag Archives: Journal
(日本語) IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 掲載決定
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					Tagged device aging, IEEE, Journal, lifetime estimation, Monte Carlo simulation, reliability				
				
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		Paper accepted for publication in Japanese Journal of Applied Physics
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					Tagged compact model, Journal, JSAP, organic circuit, power device, reliability				
				
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		Paper accepted for publication in Japanese Journal of Applied Physics
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					Tagged Journal, JSAP, organic circuit, SRAM				
				
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		IEEE Transactions on Semiconductor Manufacturing: paper accepted
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		IEEE Sensors Jornal, paper accepted
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		A paper accepted for publication in IEEE Transactions on Semiconductor Manufacturing
Hiroki Tsukamoto, Michihiro Shintani and Takashi Sato: “Statistical Extraction of Normally and Lognormally Distributed Model Parameters for Power MOSFETs,” IEEE Transactions on Semiconductor Manufacturing, (to appear). DOI: 10.1109/TSM.2020.2975300
									
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		(日本語) Japanese Journal of Applied Physicsへの論文採録決定
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		(日本語) Japanese Journal of Applied Physicsへの論文採録決定
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					Tagged Journal, organic, puf				
				
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		(日本語) IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciencesへの論文採録決定
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		(日本語) 英文論文誌 IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciencesへの論文掲載
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