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Monthly Archives: August 2014
Paper Published on IEICE Transactions on Information an Systems
The following paper has been published on IEICE Transactions on Information and Systems. IDDQ test is a way of measuring manufacturing faults in chips by measuring the leakage current while the chip is in its quiescent state (i.e., when all … Continue reading
									
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		(日本語) 京都大学オープンキャンパス2014 工学部・電気電子工学科
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(日本語) IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciencesへの論文採録決定
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		(日本語) 第27回 回路とシステムワークショップ@淡路島夢舞台国際会議場
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		(日本語) 第26回 回路とシステムワークショップ 奨励賞 受賞
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