Category Archives: Conference/Workshop

(日本語) 2019年5月VLD研究会

Posted on Tuesday May 21st, 2019 by ts
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A paper accepted for poster presentation in FLEPS2019, Grasgow

Posted on Tuesday May 14th, 2019 by ts

A paper entitled “OCM-PUF: an organic current mirror PUF with enhanced resilience to device degradation”, has been accepted for poster presentation at the 2019 IEEE International Conference on Flexible & Printable Sensors & Systems, to be held in Glasgow, Scotland … Continue reading →

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DATE2019

Posted on Monday April 8th, 2019 by ts
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ICMTS2019

Posted on Tuesday April 2nd, 2019 by ts

Two students, Tsukamoto and Saito, presented papers in the 32nd IEEE International Conference on Microelectronic Test Structure (ICMTS) 2019, at the International conference center in Kitakyushu, which was held during March 18-21, 2019. Hiroki Tsukamoto, Michihiro Shintani, and Takashi Sato, … Continue reading →

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(日本語) PUF技術シンポジウム

Posted on Saturday March 16th, 2019 by ts
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Excellent student author award for ASP-DAC2019

Posted on Friday March 15th, 2019 by ts
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Our paper has been accepted for presentation in DAC2019 Las Vegas!

Posted on Thursday February 7th, 2019 by ts

The following paper has been accepted for presentation in DAC2019（ACM/IEEE Design Automation Conference 2019） (acceptance rate 24.8%=202/815). Conguratulations!! Song Bian, Masayuki Hiromoto, and Takashi Sato, “Filianore: Better multiplier architectures for LWE-based post-quantum key exchange,” in Proc. ACM/IEEE Design Automation Conference … Continue reading →

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Paper presented in ASP-DAC2019

Posted on Monday February 4th, 2019 by ts

A Ph.D student, Song gave an oral presentation in Asia and South Pacific Design Automation Conference (ASP-DAC) 2019 held at the National Musium of Science and Art during Jan. 21-24, 2019. (The presentation was on Jan. 25th.) His presentation is … Continue reading →

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Design gaia 2018

Posted on Wednesday December 19th, 2018 by ts
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Papers accepted for presentation in ICMTS 2019

Posted on Wednesday December 12th, 2018 by ts

Two papers have been accepted for presentation in ICMTS 2019 (International Conference on Microelectronic Test Structures). Michiaki Saito, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato, “A compact model of I-V characteristic degradation for organic thin film transistors,” in … Continue reading →

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