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- ▼2021 (2)
- ▼January (2)
- Japanese Journal of Applied Physicsへの論文採録決定Paper accepted for publication in Japanese Journal of Applied PhysicsPaper accepted for publication in Japanese Journal of Applied Physics
- Japanese Journal of Applied Physicsへの論文採録決定Paper accepted for publication in Japanese Journal of Applied PhysicsPaper accepted for publication in Japanese Journal of Applied Physics
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Category Archives: Publication
Paper accepted for publication in Japanese Journal of Applied Physics
Sorry, this entry is only available in 日本語.
Posted in Publication
Tagged compact model, Journal, JSAP, organic circuit, power device, reliability
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Paper accepted for publication in Japanese Journal of Applied Physics
Sorry, this entry is only available in 日本語.
Posted in Publication
Tagged Journal, JSAP, organic circuit, SRAM
Comments Off on Paper accepted for publication in Japanese Journal of Applied Physics
MICCAI2020: paper accepted
The following paper has been accepted for presentation in the International Conference on Medical Image Computing and Computer Assisted Intervention (MICCAI) 2020. This work is in collaboration with the JSPS visiting scholar Associate Professor Yiyu Shi from the University of … Continue reading
Posted in Publication
Tagged image segmentation, medical security, secure inference, secure multi-party computation
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IEEE Trans. Semicond. Manufact.: paper accepted
Sorry, this entry is only available in 日本語.
Posted in Publication
Tagged device model, IEEE, Journal, organic
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IEEE Sensors Jornal, paper accepted
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Posted in Publication
Tagged IEEE, Journal, puf, security
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A paper has been accepted for publication in IEEE Transactions on Information Forensics & Security
The following paper has been accepted for publication in IEEE Transactions on Information Forensics & Security. Yue Zheng, Xiaojin Zhao, Takashi Sato, Yuan Cao, and Chip-Hong Chang: “Ed-PUF: Event-driven Physical Unclonable Function for Camera Authentication in Reactive Monitoring System,” IEEE … Continue reading
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Tagged IEEE, security, TIFS
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A paper accepted for publication in IEEE Transactions on Semiconductor Manufacturing
Hiroki Tsukamoto, Michihiro Shintani and Takashi Sato: “Statistical Extraction of Normally and Lognormally Distributed Model Parameters for Power MOSFETs,” IEEE Transactions on Semiconductor Manufacturing, (to appear). DOI: 10.1109/TSM.2020.2975300
Posted in Publication
Tagged device model, IEEE, Journal, power electronics
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(日本語) Japanese Journal of Applied Physicsへの論文採録決定
Sorry, this entry is only available in 日本語.
Posted in Publication
Tagged device model, Journal, JSAP, organic, reliability
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