Author Archives: ts

DA symposium

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(日本語) 情報処理学会コンピュータサイエンス領域奨励賞受賞

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(日本語) DAシンポジウム2020優秀発表学生賞

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DAC2020

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IEEE Trans. Semicond. Manufact.: paper accepted

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IEEE Sensors Jornal, paper accepted

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(日本語) VLSI設計技術研究会2020年3月

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A paper has been accepted for publication in IEEE Transactions on Information Forensics & Security

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IEICE VLD Excellent Student Author Award for ASP-DAC 2020

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A paper accepted for publication in IEEE Transactions on Semiconductor Manufacturing

Hiroki Tsukamoto, Michihiro Shintani and Takashi Sato: “Statistical Extraction of Normally and Lognormally Distributed Model Parameters for Power MOSFETs,” IEEE Transactions on Semiconductor Manufacturing, (to appear). DOI: 10.1109/TSM.2020.2975300

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