Author Archives: ts

Lecture talk of Dr. Chun-Wei Lin

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VMC2017

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(日本語) SSDM2017

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(日本語) Cheng Zhuo先生講演会

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JST Fair 2017

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Paper published in IEEE Trans. VLSI

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(日本語) Jerald Yoo先生講演会

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ICMTS 2017

Mr. Oishi presented his paper at International Conference on Microelectronic Test Structures (ICMTS) 2017 held in Grenoble, France. Mr. Oishi’s talk was about input capacitance measurement of power MOSFETs. The modeling of the input capacitance is crucial for the simulation … Continue reading

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ACM/IEEE ASPDAC 2017

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Paper accepted for publication in IEEE Transactions on Very Large Scale Integration Systems

The following paper has been accepted for publication in IEEE Transactions on Very Large Scale Integration Systems (TVLSI). Hiromitsu Awano, Shumpei Morita, and Takashi Sato: “Scalable device array for statistical characterization of BTI-related parameters,” IEEE Transactions on Very Large Scale … Continue reading

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